6

Micro-Raman spectroscopy measurement of stress in silicon

Year:
2007
Language:
english
File:
PDF, 128 KB
english, 2007
10

Effective density-of-states approach to QM correction in MOS structures

Year:
2000
Language:
english
File:
PDF, 213 KB
english, 2000
15

NiCuZn ferrite thin films for RF integrated inductors

Year:
2006
Language:
english
File:
PDF, 183 KB
english, 2006
21

On the degeneracy of quantized inversion layer in MOS structures

Year:
2000
Language:
english
File:
PDF, 474 KB
english, 2000